http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
linear and nonlinear optical spectroscopy of surfaces and interfaces
1 online resource (xii, 230 pages) : illustrations.
This book describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These new "epioptic" techniques have now been quite widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
The linear optical response / R. Del Sole [and others] -- Spectroscopic ellipsometry / U. Rossow -- Reflection difference techniques / D.R.T. Zahn -- Raman spectroscopy / W. Richter -- Photoluminescence spectroscopy / Z. Sobiesierski -- On the theory of second harmonic generation / A. d'Andrea [and others] -- Second harmonic and sum frequency generation / J.F. McGilp.
J.F. McGilp, D. Weaire, C.H. Patterson, eds.
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
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Includes bibliographical references and index.