rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Epioptics
    sub title: linear and nonlinear optical spectroscopy of surfaces and interfaces
  name:
    name part: McGilp, J.
  name:
    name part: Weaire, D. L.
  name:
    name part: Patterson, C. H. (Charles H.)
    name part: 1961-
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: gw
    date issued: 1995
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: preservation
    reformatting quality: access
    form: remote
    extent: 1 online resource (xii, 230 pages) : illustrations.
  abstract: This book describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These new "epioptic" techniques have now been quite widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
  table of contents: The linear optical response / R. Del Sole [and others] -- Spectroscopic ellipsometry / U. Rossow -- Reflection difference techniques / D.R.T. Zahn -- Raman spectroscopy / W. Richter -- Photoluminescence spectroscopy / Z. Sobiesierski -- On the theory of second harmonic generation / A. d'Andrea [and others] -- Second harmonic and sum frequency generation / J.F. McGilp.
  note: J.F. McGilp, D. Weaire, C.H. Patterson, eds.
  note: Electronic resource.
  note: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
  note: digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
  note: Includes bibliographical references and index.
  subject:
    topic: Semiconductors
    topic: Surfaces
    topic: Optical properties
  subject:
    topic: Semiconductors
    topic: Junctions
    topic: Optical properties
  subject:
    topic: Surfaces (Physics)
    topic: Optical properties
  subject:
    topic: Spectrum analysis
  subject:
    topic: Semiconductors
    topic: Optical properties
  classification: QC611.6.S9 E64 1995
  classification: 537.6/226
  classification: QU 05
  classification: 33.73
  related item:
    title info:
      title: Epioptics
    origin info:
      publisher: Berlin ; New York : Springer, ©1995
    identifier: (DLC) 95037998
    identifier: (OCoLC)33078356
  related item:
    title info:
      title: ESPRIT basic research series
  identifier: 9783642798207 (electronic bk.)
  identifier: 3642798209 (electronic bk.)
  identifier: 3540594108 (hardcover : alk. paper)
  identifier: 9783540594109 (hardcover : alk. paper)
  identifier: 9783642798221
  identifier: 3642798225
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OCLCE
    record creation date: 100429
    record change date: 20260422205344.0
    record identifier: in00003513747
    language of cataloging:
      language term: eng