Epioptics : linear and nonlinear optical spectroscopy of surfaces and interfaces /
This book describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These new "epioptic" techniques have now been quite widely applied to semiconductor surfaces and interfaces, and include pola...
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[1995]
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| Series: | ESPRIT basic research series.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This book describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These new "epioptic" techniques have now been quite widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces. |
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| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (xii, 230 pages) : illustrations. |
| Format: | Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783642798207 (electronic bk.) 3642798209 (electronic bk.) |