Beam effects, surface topography, and depth profiling in surface analysis /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
New York :
Plenum Press,
[1998]
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| Series: | Methods of surface characterization ;
v. 5. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
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| Physical Description: | 1 online resource (xix, 430 pages) : illustrations |
| Bibliography: | Includes bibliographical references and index. |