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High performance memory testing : design principles, fault modeling, and self-test /

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Bibliographic Details
Main Author: Adams, R. Dean
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston : Kluwer Academic, [2003]
Series:Frontiers in electronic testing.
Subjects:
Semiconductor storage devices > Testing.
Computer storage devices > Testing.
Semiconductor storage devices.
Engineering.
Electrical engineering.
COMPUTERS > Machine Theory.
COMPUTERS > Computer Engineering.
COMPUTERS > Hardware > General.
Electronic books.
Online Access:Connect to the full text of this electronic book
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by Adams, R. Dean
Published 2003
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