High performance memory testing : design principles, fault modeling, and self-test /

Bibliographic Details
Main Author:	Adams, R. Dean
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Boston : Kluwer Academic, [2003]
Series:	Frontiers in electronic testing.
Subjects:	Semiconductor storage devices > Testing. Computer storage devices > Testing. Semiconductor storage devices. Engineering. Electrical engineering. COMPUTERS > Machine Theory. COMPUTERS > Computer Engineering. COMPUTERS > Hardware > General. Electronic books.
Online Access:	Connect to the full text of this electronic book

Description
Item Description:	Electronic resource.
Physical Description:	1 online resource (xiii, 246 pages) : illustrations.
Bibliography:	Includes bibliographical references (pages 229-239) and index.
ISBN:	1402072554 9781402072550 0306479729 9780306479724 9781601193445 1601193440