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Nondestructive evaluation of semiconductor materials and devices : [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September 19-29, 1978] /

Bibliographic Details
Corporate Authors: NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices Villa Tuscolano, Italy, SpringerLink (Online service), North Atlantic Treaty Organization. Scientific Affairs Division
Other Authors: Zemel, Jay N.
Format: Conference Proceeding eBook
Language:English
Published: New York : Plenum Press, [1979]
Series:NATO advanced study institutes series. Physics ; v. 46.
Subjects:
Semiconductors > Testing > Congresses.
Semiconducteurs > Essais > Congrès.
Charakterisierung.
Halbleiter.
Halbleiterwerkstoff.
Kongre€.
Werkstoffprüfung.
Zuverlässigkeit.
Semiconductors > Testing.
Electronic books.
Frascat (1978)
Kongress.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"Published in cooperation with NATO Scientific Affairs Division."
Electronic resource.
Physical Description:1 online resource (xi, 782 pages) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:9781475713527 (electronic bk.)
1475713525 (electronic bk.)