Cover Image

Power-constrained testing of VLSI circuits /

Show other versions (2)
Bibliographic Details
Main Author: Nicolici, Nicola
Corporate Author: SpringerLink (Online service)
Other Authors: Al-Hashimi, Bashir
Format: eBook
Language:English
Published: Boston : Kluwer Academic Publishers, [2003]
Series:Frontiers in electronic testing ; 22.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Protection.
Semiconductors > Thermal properties.
Electronic books.
Online Access:Connect to the full text of this electronic book
Search Result 1
Cover Image
by Nicolici, Nicola
Published 2003
Book
Search Result 2
Cover Image
by Nicolici, Nicola
Published 2003
Connect to the full text of this electronic book
eBook
Show all versions (3)