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Power-constrained testing of VLSI circuits /

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Bibliographic Details
Main Author: Nicolici, Nicola
Corporate Author: SpringerLink (Online service)
Other Authors: Al-Hashimi, Bashir
Format: eBook
Language:English
Published: Boston : Kluwer Academic Publishers, [2003]
Series:Frontiers in electronic testing ; 22.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Protection.
Semiconductors > Thermal properties.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xi, 178 pages) : illustrations
Bibliography:Includes bibliographical references (pages 163-173) and index.
ISBN:140207235X (alk. paper)
9781402072352 (alk. paper)