Reliability and failure of electronic materials and devices /
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| Format: | eBook |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Academic Press is an imprint of Elsevier,
2014.
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| Edition: | Second edition. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Includes index. Machine generated contents note: CH 1 An Overview of Electronic Devices and Their Reliability CH 2 Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated CH 3 Defects, Contamination and Yield CH 4 The Mathematics of Failure and Reliability CH 5 Mass Transport-Induced Failure Ch 6 Electronic Charge-Induced Damage CH 7 Environmental Damage to Electronic Products CH 8 Packaging Materials, Processes, and Stresses CH 9 Degradation of Contacts and Packages CH 10 Degradation and Failure of Electro-Optical and Magnetic Materials and Devices CH 11 Characterization and Failure Analysis of Material, Devices and Packages CH 12 Future Directions and Reliability Issues. Electronic resource. |
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| Physical Description: | 1 online resource. |
| ISBN: | 9780080575520 0080575528 |