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Elastic and inelastic scattering in electron diffraction and imaging /

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This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes pr...

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Bibliographic Details
Main Author: Wang, Zhong Lin
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York : Plenum Press, [1995]
Series:Language of science.
Subjects:
Scattering (Physics)
Electrons > Diffraction.
Imaging systems.
Electron microscopy.
Microscopie électronique.
Électrons > Diffraction.
Elektronenbeugung.
Elektronenstreuung.
Scattering
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes principles, techniques, and applications in his discussions of thermal diffusely scattered, valence-loss, and atomic inner-shell scattered electrons in compositional sensitive imaging.
Item Description:Electronic resource.
Physical Description:1 online resource (xxvii, 448 pages) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references (pages 433-441) and index.
ISBN:9781489915795 (electronic bk.)
1489915796 (electronic bk.)