Efficient Path Delay Test Generation with Boolean Satisfiability /

Low cost power and supply noise estimation and control in scan testing of VLSI circuits /
by: Jiang, Zhongwei
Published: (2012)

Heuristics Based Test Overhead Reduction Techniques in VLSI Circuits /
by: Chakraborty, Avijit
Published: (2023)

At-Speed Path Delay Test /
by: Chakraborty, Swati
Published: (2015)

Pseudo Functional Path Delay Test through Embedded Memories /
by: Gao, Yukun
Published: (2015)

Fault simulation and test generation for small delay faults /
by: Qiu, Wangqi, 1978-
Published: (2007)

Built-in self test (BIST) for realistic delay defects /
by: Tamilarasan, Karthik Prabhu
Published: (2012)

Maximizing crosstalk-induced slowdown during path delay test /
by: Gope, Dibakar
Published: (2012)

Fault modeling, delay evaluation and path selection for delay test under process variation in nano-scale VLSI circuits /
by: Lu, Xiang, 1976-
Published: (2006)

Power supply noise in delay testing /
by: Wang, Jing
Published: (2010)

Estimating the expected latency to failure due to manufacturing defects /
by: Dorsey, David Michael, 1980-
Published: (2004)

Theory and applications of satisfiability testing : 8th international conference, SAT 2005, St Andrews, UK, June 19-23, 2005 : proceedings /
Published: (2005)

10 SATs : plus advice from the College Board on how to prepare for them.
Published: (1990)

Practice for scholastic aptitude tests : complete preparation for the scholastic aptitude test, preliminary scholastic aptitude test, and the National Merit Scholarship qualifying test.
Published: (1977)

An investigation of item obsolescence in the Scholastic Aptitude Test : prepared for the Advisory Panel on the Scholastic Aptitude Test Score Decline /
by: Braswell, James S.
Published: (1977)

Effects of coaching on scholastic aptitude test scores.
Published: (1968)

Scholastic aptitude test : college entrance examination board /
by: Turner, David R. (David Reuben), 1915-2006
Published: (1977)

Towards More Efficient Delay Measurements on the Internet /
by: Webster, Patrick Jordan
Published: (2013)

On the modeling of time-varying delays /
by: Shah, Chirag, 1978-
Published: (2004)

Preparation for the SAT, scholastic aptitude test /
Published: (1989)

Preparation for the SAT* Scholastic Aptitude Test /
Published: (1992)

Cliffs SAT I reasoning test preparation guide /
by: Bobrow, Jerry
Published: (1994)

Testing for higher education ; cultural perspective and future focus /
by: Barclay, James Ralph, 1926-
Published: (1965)

S.A.T. student preparation course.
Published: (1981)

Guidelines for improving SAT scores /
by: Thomson, Scott D.
Published: (1978)

The case against the SAT /
by: Crouse, James
Published: (1988)

Life with the SAT : assessing our young people and our times /
by: Hanford, George H.
Published: (1991)

Empirical timing analysis of CPUs and delay fault tolerant design using partial redundancy /
by: Chang, Sanghoan
Published: (2010)

Delay fault testing for VLSI circuits /
by: Krstić, Angela, 1965-
Published: (1998)

The use, acceptance, and impact of Taking the SAT : a test familiarization booklet /
by: Powers, Donald E.
Published: (1979)

The SAT TV review /
Published: (1987)

Evaluation and application of delayed neutron precursor data /
by: Brady, Michaele Clarice, 1959-
Published: (1988)

Changes in the verbal abilities of high school seniors, college entrants, and SAT candidates between 1960 and 1972 : prepared for the Advisory Panel on the Scholastic Aptitude Test Score Decline /
by: Beaton, Albert E.
Published: (1977)

Effect of varying the delay distribution in different classes of networks : random, scale-free, and small-world /
by: Jang, Bum Soon
Published: (2010)

Cracking the SAT.
Published: (2006)

Maximum and minimum sensitizable timing analysis using data dependent delays /
by: Singh, Karandeep
Published: (2007)

Adapting a delay-based protocol to heterogeneous environments /
by: Kotla, Kiran, 1983-
Published: (2008)