Applied measurement with jMetrik /

Bibliographic Details
Main Author: Meyer, J. Patrick (Author)
Corporate Author: ebrary, Inc
Format: eBook
Language:English
Published: New York, NY : Routledge, 2014.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource.
Bibliography:Includes bibliographical references and index.
ISBN:0203115198 (electronic bk.)
9780203115190 (electronic bk.)