Electron microscopy, 1980 : proceedings of the Seventh European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980.

Bibliographic Details
Corporate Authors: European Congress on Electron Microscopy Ha gue, Netherlands, International Congress on X-ray Optics and Microanalysis
Other Authors: Brederoo, P.
Format: Conference Proceeding Book
Language:English
Published: Leiden : Seventh European Congress on Electron Microscopy Foundation, 1980.
Subjects:
Description
Item Description:Editors, P. Brederoo and others
Incorporated the Ninth International Conference on X-ray Optics and Microanalysis.
Physical Description:4 volumes : illustrations ; 27 cm.
Bibliography:Includes bibliographical references and index.