Interferometry for precision measurement /

Bibliographic Details
Main Author: Langenbeck, Peter (Author)
Format: Book
Language:English
Published: Bellingham, Washington, USA : SPIE Press, [2014]
Series:Tutorial texts in optical engineering ; v. TT 94.
Subjects:
Table of Contents:
  • Known methods : an assessment of the state of the art, Newton and Fizeau
  • From extended light source to collimated illumination
  • Interferences visualized by vector diagrams
  • Optical laboratory equipment
  • Straight lines and right angles
  • Polygons
  • Optical shop daily tasks
  • Specular technical mass-produced surfaces
  • Non-specular, near-flat, mass-produced surfaces
  • Enhancing regular interferometric sensitivity.