Interferometry for precision measurement /

Bibliographic Details
Main Author: Langenbeck, Peter (Author)
Format: Book
Language:English
Published: Bellingham, Washington, USA : SPIE Press, [2014]
Series:Tutorial texts in optical engineering ; v. TT 94.
Subjects:
Description
Physical Description:xiv, 243 pages : illustrations (some color) ; 26 cm
Bibliography:Includes bibliographical references and index.
ISBN:9780819491404 (print)
0819491403 (print)