Modeling bipolar power semiconductor devices /
| Other Authors: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
[San Rafael, Calif.] :
Morgan & Claypool,
[2013]
|
| Series: | Synthesis lectures on power electronics ;
#5. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- 1. Introduction to power semiconductor device modeling
- 2. Physics of power semiconductor devices
- 2.1 On-state operation of bipolar devices
- 2.1.1 Lightly doped drift region
- 2.1.2 Depletion region
- 2.1.3 Emitter regions
- 2.1.4 Base or gate regions
- 2.1.5 N buffer layer region
- 2.1.6 MOS gate
- 2.2 Off state
- 3. Modeling of a power diode and IGBT
- 3.1 Modeling a power diode
- 3.1.1 P+ emitter region
- 3.1.2 N- drift region
- 3.1.3 N+ emitter region
- 3.1.4 Voltage drop
- 3.2 Modeling an NPT IGBT
- 3.2.1 P emitter region
- 3.2.2 N- drift region
- 3.2.3 MOS region
- 3.2.4 Voltage drop
- 4. IGBT under an inductive load-switching condition in Simulink
- 4.1 Electrical circuit in Simulink
- 4.2 Diode subsystem
- 4.3 NPT IGBT subsystem
- 5. Parameter extraction
- 5.1 Parameter estimation for power diodes
- 5.1.1 Area A
- 5.1.2 High-level injection lifetime HL
- 5.1.3 Drift region doping NN-
- 5.1.4 Drift region width WN-
- 5.1.5 Recombination parameters hn and hp
- 5.2 Parameter estimation for IGBTs
- 5.2.1 MOS parameters
- 5.2.2 IGBT geometry parameters
- 5.2.3 IGBT drift region parameters
- 5.2.4 IGBT lifetime parameters
- 5.2.5 IGBT recombination and buffer layer parameters
- 5.3 Initial circuit parameter estimation
- References
- Authors' biographies.