Table of Contents:
  • 1. Introduction to power semiconductor device modeling
  • 2. Physics of power semiconductor devices
  • 2.1 On-state operation of bipolar devices
  • 2.1.1 Lightly doped drift region
  • 2.1.2 Depletion region
  • 2.1.3 Emitter regions
  • 2.1.4 Base or gate regions
  • 2.1.5 N buffer layer region
  • 2.1.6 MOS gate
  • 2.2 Off state
  • 3. Modeling of a power diode and IGBT
  • 3.1 Modeling a power diode
  • 3.1.1 P+ emitter region
  • 3.1.2 N- drift region
  • 3.1.3 N+ emitter region
  • 3.1.4 Voltage drop
  • 3.2 Modeling an NPT IGBT
  • 3.2.1 P emitter region
  • 3.2.2 N- drift region
  • 3.2.3 MOS region
  • 3.2.4 Voltage drop
  • 4. IGBT under an inductive load-switching condition in Simulink
  • 4.1 Electrical circuit in Simulink
  • 4.2 Diode subsystem
  • 4.3 NPT IGBT subsystem
  • 5. Parameter extraction
  • 5.1 Parameter estimation for power diodes
  • 5.1.1 Area A
  • 5.1.2 High-level injection lifetime HL
  • 5.1.3 Drift region doping NN-
  • 5.1.4 Drift region width WN-
  • 5.1.5 Recombination parameters hn and hp
  • 5.2 Parameter estimation for IGBTs
  • 5.2.1 MOS parameters
  • 5.2.2 IGBT geometry parameters
  • 5.2.3 IGBT drift region parameters
  • 5.2.4 IGBT lifetime parameters
  • 5.2.5 IGBT recombination and buffer layer parameters
  • 5.3 Initial circuit parameter estimation
  • References
  • Authors' biographies.