Cover Image

Correlation between analog noise measurements and the expected bit error rate of a digital signal propagating through passive components /

Bibliographic Details
Main Authors:	Warner, Joseph D. (Author), Theofylaktos, Onoufrios (Author)
Format:	Government Document eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2012]
Series:	NASA technical memorandum ; 217238.
Subjects:	Cosmic rays. Logic circuits. Bit error rate. Circuits. Correlation.
Online Access:	https://purl.fdlp.gov/GPO/gpo39211

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