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On the effect of ramp rate in damage accumulation of the CPV die-attach : preprint /

Bibliographic Details
Main Author: Bosco, Nick
Corporate Authors: National Renewable Energy Laboratory (U.S.), IEEE Photovoltaic Specialists Conference
Other Authors: Silverman, Timothy J., Kurtz, S. R.
Format: Government Document Conference Proceeding eBook
Language:English
Published: [Golden, Colo.] : National Renewable Energy Laboratory, [2012]
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-54092.
Subjects:
Photovoltaic cells.
Solder and soldering.
Online Access:https://purl.fdlp.gov/GPO/gpo26400
Description
Item Description:Title from title screen (viewed on Aug. 6, 2012).
"June 2012."
"Presented at the 2012 IEEE Photovoltaic Specialists Conference, Austin, Taxas, June 3-8, 2012."
Electronic resource.
Physical Description:1 online resource (6 pages) : illustrations (some color).
Bibliography:Includes bibliographical references (page 6).