Surface science techniques /
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2013]
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| Series: | Springer series in surface sciences ;
51. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Macroscopic Techniques
- Contact Angle and Wetting Properties / Yuehua Yuan, T. Randall Lee
- Adsorption Calorimetry on Well-Defined Surfaces / Ole Lytken, Hans-Jörg Drescher, Rickmer Kose, J. Michael Gottfried
- Optical techniques
- Methods of IR Spectroscopy for Surfaces and Thin Films / David Allara, Josh Stapleton
- A Surface Scientist's View on Spectroscopic Ellipsometry / Maurizio Canepa
- Nonlinear Vibrational Spectroscopy / Lee J. Richter
- X ray Techniques
- Grazing Incidence X-Ray Diffraction / Osami Sakata, Masashi Nakamura
- X-Ray Reflectivity / A. Gibaud, M. S. Chebil, T. Beuvier
- Resonant Photoelectron Diffraction / Alberto Verdini, Peter Krüger, Luca Floreano
- Surface Structure Analysis with X-Ray Standing Waves / Jörg Zegenhagen
- Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces / Alexei Nefedov, Christof Wöll
- Neutral Particle Techniques
- Neutron Reflectivity / Frédéric Ott
- Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch / Bodil Holst, Gianangelo Bracco
- The Helium Spin-Echo Method / Andrew Jardine
- Diffraction of H2 from Metal Surfaces / Daniel Farías, Marina Minniti, Rodolfo Miranda
- Charged Particle Techniques
- Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science / Vladimir A. Esaulov
- Helium Ion Microscopy / Diederik J. Maas, Raoul van Gastel
- High Resolution Electron Energy Loss Spectroscopy (HREELS): A Sensitive and Versatile Surface Tool / Luca Vattuone, Letizia Savio, Mario Rocca
- Low-Energy Electron Microscopy / Juan de la Figuera, Kevin F. McCarty
- Scanning Probe Techniques
- Scanning Tunneling Microscopy / Ada Della Pia, Giovanni Costantini
- Surface Characterization Using Atomic Force Microscopy (AFM) in Liquid Environments / Venetia D. Lyles, Wilson K. Serem, Jing-Jiang Yu, Jayne C. Garno
- Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures
- Franciszek Krok,
- Bartosz Such,
- Jacek J. Kolodziej,
- Marek Szymonski.