http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Macroscopic Techniques -- Contact Angle and Wetting Properties / Yuehua Yuan, T. Randall Lee -- Adsorption Calorimetry on Well-Defined Surfaces / Ole Lytken, Hans-Jörg Drescher, Rickmer Kose, J. Michael Gottfried -- Optical techniques -- Methods of IR Spectroscopy for Surfaces and Thin Films / David Allara, Josh Stapleton -- A Surface Scientist's View on Spectroscopic Ellipsometry / Maurizio Canepa -- Nonlinear Vibrational Spectroscopy / Lee J. Richter -- X ray Techniques -- Grazing Incidence X-Ray Diffraction / Osami Sakata, Masashi Nakamura -- X-Ray Reflectivity / A. Gibaud, M. S. Chebil, T. Beuvier -- Resonant Photoelectron Diffraction / Alberto Verdini, Peter Krüger, Luca Floreano -- Surface Structure Analysis with X-Ray Standing Waves / Jörg Zegenhagen -- Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces / Alexei Nefedov, Christof Wöll -- Neutral Particle Techniques -- Neutron Reflectivity / Frédéric Ott -- Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch / Bodil Holst, Gianangelo Bracco -- The Helium Spin-Echo Method / Andrew Jardine -- Diffraction of H2 from Metal Surfaces / Daniel Farías, Marina Minniti, Rodolfo Miranda -- Charged Particle Techniques -- Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science / Vladimir A. Esaulov -- Helium Ion Microscopy / Diederik J. Maas, Raoul van Gastel -- High Resolution Electron Energy Loss Spectroscopy (HREELS): A Sensitive and Versatile Surface Tool / Luca Vattuone, Letizia Savio, Mario Rocca -- Low-Energy Electron Microscopy / Juan de la Figuera, Kevin F. McCarty -- Scanning Probe Techniques -- Scanning Tunneling Microscopy / Ada Della Pia, Giovanni Costantini -- Surface Characterization Using Atomic Force Microscopy (AFM) in Liquid Environments / Venetia D. Lyles, Wilson K. Serem, Jing-Jiang Yu, Jayne C. Garno -- Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures -- Franciszek Krok, -- Bartosz Such, -- Jacek J. Kolodziej, -- Marek Szymonski.
Gianangelo Bracco, Bodil Holst, editors.
Includes bibliographical references and index.
Surface and Interface Science, Thin Films.
Measurement Science and Instrumentation.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Springer series in surface sciences ; 51