rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Surface science techniques
  name:
    name part: Bracco, Gianangelo.
  name:
    name part: Holst, Bodil.
  name:
    name part: Ebook Library
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: gw
    date issued: 2013
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource.
  table of contents: Macroscopic Techniques -- Contact Angle and Wetting Properties / Yuehua Yuan, T. Randall Lee -- Adsorption Calorimetry on Well-Defined Surfaces / Ole Lytken, Hans-Jörg Drescher, Rickmer Kose, J. Michael Gottfried -- Optical techniques -- Methods of IR Spectroscopy for Surfaces and Thin Films / David Allara, Josh Stapleton -- A Surface Scientist's View on Spectroscopic Ellipsometry / Maurizio Canepa -- Nonlinear Vibrational Spectroscopy / Lee J. Richter -- X ray Techniques -- Grazing Incidence X-Ray Diffraction / Osami Sakata, Masashi Nakamura -- X-Ray Reflectivity / A. Gibaud, M. S. Chebil, T. Beuvier -- Resonant Photoelectron Diffraction / Alberto Verdini, Peter Krüger, Luca Floreano -- Surface Structure Analysis with X-Ray Standing Waves / Jörg Zegenhagen -- Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces / Alexei Nefedov, Christof Wöll -- Neutral Particle Techniques -- Neutron Reflectivity / Frédéric Ott -- Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch / Bodil Holst, Gianangelo Bracco -- The Helium Spin-Echo Method / Andrew Jardine -- Diffraction of H2 from Metal Surfaces / Daniel Farías, Marina Minniti, Rodolfo Miranda -- Charged Particle Techniques -- Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science / Vladimir A. Esaulov -- Helium Ion Microscopy / Diederik J. Maas, Raoul van Gastel -- High Resolution Electron Energy Loss Spectroscopy (HREELS): A Sensitive and Versatile Surface Tool / Luca Vattuone, Letizia Savio, Mario Rocca -- Low-Energy Electron Microscopy / Juan de la Figuera, Kevin F. McCarty -- Scanning Probe Techniques -- Scanning Tunneling Microscopy / Ada Della Pia, Giovanni Costantini -- Surface Characterization Using Atomic Force Microscopy (AFM) in Liquid Environments / Venetia D. Lyles, Wilson K. Serem, Jing-Jiang Yu, Jayne C. Garno -- Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures -- Franciszek Krok, -- Bartosz Such, -…
  note: Gianangelo Bracco, Bodil Holst, editors.
  note: Electronic resource.
  note: Includes bibliographical references and index.
  subject:
    topic: Surfaces (Technology)
  subject:
    topic: Surfaces (Technology)
    topic: Analysis
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Physics.
  subject:
    topic: Nanotechnology.
  subject:
    topic: Surface and Interface Science, Thin Films.
  subject:
    topic: Measurement Science and Instrumentation.
  subject:
    topic: Optics, Optoelectronics, Plasmonics and Optical Devices.
  subject:
    topic: Nanoscale Science and Technology.
  classification: TA418.7 .S87 2013eb
  classification: 620/.44
  related item:
    title info:
      title: Springer series in surface sciences ; 51
  identifier: 9783642342431 (electronic bk.)
  identifier: 3642342434 (electronic bk.)
  identifier: 9783642342424
  identifier: https://ebookcentral.proquest.com/lib/tamucs/detail.action
  record info:
    record content source: GW5XE
    record creation date: 130205
    record change date: 20250816205005.0
    record identifier: in00003244094