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X-ray fluorescence spectrometry and related techniques : an introduction /

Bibliographic Details
Main Author: Marguí, Eva
Corporate Author: ebrary, Inc
Other Authors: Grieken, R. van (René)
Format: eBook
Language:English
Published: [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013.
Subjects:
X-ray spectroscopy.
X-ray fluorescence spectrometry (XRF)
Energy dispersive X-ray fluorescence spectrometry (EDXRF)
Wavelength dispersive X-ray fluorescence spectrometry (WDXRF)
Total reflection X-ray fluorescence spectrometry (TXRF)
Micro-XRF
Synchrotron radiation-induced X-ray emission (SRXRF)
Metals
Sample preparation
XRF instrumentation
Industrial analysis
Environmental analysis
Geochemical analysis
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Abstract:X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF.
Item Description:Electronic resource.
Physical Description:1 online resource (xv, 142 pages) : illustrations
Also available in print.
Format:Mode of access: World Wide Web.
System requirements: Adobe Acrobat reader.
Bibliography:Includes bibliographical references (pages 133-138) and index.
ISBN:9781606503935 (electronic bk.)
1606503936 (electronic bk.)