A practical guide to optical metrology for thin films /

Bibliographic Details
Main Author: Quinten, Michael
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, [2013]
Series:Wiley Online Library.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xii, 211 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:3527664343 (electronic bk.)
3527664351
9783527664344 (electronic bk.)
9783527664351
DOI:10.1002/9783527664344