rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Fourth optical inspection of integrated circuits using image processing and mathematical morphology
    sub title: a report
  name:
    name part: Chemaly, Ephrem A.
    role:
      role term: creator
  name:
    name part: Texas A & M University
    name part: College of Engineering.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: xx
    date issued: 1986
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vii, 133 leaves : illustrations ; 28 cm.
  abstract: As competition gets tighter in the industrial world, many manufacturers are switching from the classical labor intensive methods of production to more sophisticated techniques using automation. At the microprocessor division of Motorola Inc. this approach was taken in a systematic manner. An automation group was founded with the ultimate goal of automating the testing procedures of their product. This testing procedure consists of two major tasks. First an electrical test is performed on the microprocessors to insure that they meet the required electrical specifications. Second a visual inspection of the packages is undertaken to reject the parts with surface flows, such as bubbles, blisters, chips, cracks, and voids. The latter inspection will be of interest to us in this dissertation. The purpose of this work is to perform the visual inspection automatically. The method used is image processing. In particular mathematical morphology is viable because it is the study of shapes. As we will find in this report, defects are merely abnormal shapes of the packages.
  note: by Ephrem A. Chemaly.
  note: "Submitted to the Graduate College of Texas A & M University in partial fulfillment of the requirement for the degree of Doctor of Engineering."
  note: "Dec 1986."
  note: "Major subject: Electrical Engineering."
  note: Includes bibliographical references.
  subject:
    geographic code: n-us-tx
  subject:
    topic: Electrical engineering
    geographic: Texas
    geographic: Austin
  subject:
    topic: Microprocessors
    geographic: Texas
    geographic: Austin
    topic: Design and construction
  subject:
    topic: Quality control
    geographic: Texas
    geographic: Austin
    topic: Optical methods
  subject:
    topic: Image processing
    topic: Mathematics
  subject:
    topic: Integrated circuits
    topic: Inspection
    topic: Automation
  subject:
    name:
      name part: Motorola, Inc.
  subject:
    topic: Major Electrical Engineering
  identifier: http://hdl.handle.net/1969.1/PILO-TAMU-4019381
  related item:
    location:
      url: http://hdl.handle.net/1969.1/PILO-TAMU-4019381
  record info:
    record content source: TXA
    record creation date: 120925
    record change date: 20150922120718.0
    record identifier: in00002780579