Optical imaging and metrology : advanced technologies /
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leadin...
| Other Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
2012.
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| Series: | Wiley Online Library.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends. |
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| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (xxi, 482 pages) : color illustrations |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 3527648445 (electronic bk.) 3527648453 (electronic bk.) 3527648461 (electronic bk.) 352764847X (electronic bk.) 9783527648443 (electronic bk.) 9783527648450 (electronic bk.) 9783527648467 (electronic bk.) 9783527648474 (electronic bk.) |
| DOI: | 10.1002/9783527648443 |