Handbook of nanoscopy /
| Other Authors: | , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
[2012]
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| Series: | Wiley Online Library.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Front Matter
- The Past, the Present, and the Future of Nanoscopy / Gustaaf Van Tendeloo, Dirk Van Dyck
- Methods. Transmission Electron Microscopy / Marc De Graef
- Atomic Resolution Electron Microscopy / Dirk Van Dyck
- Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration / Knut W Urban, Juri Barthel, Lothar Houben, Chun-Lin Jia, Markus Lentzen, Andreas Thust, Karsten Tillmann
- Z-Contrast Imaging / Stephen J Pennycook, Anrew R Lupini, Albina Y Borisevich, Mark P Oxley
- Electron Holography / Hannes Lichte
- Lorentz Microscopy and Electron Holography of Magnetic Materials / Rafal E Dunin-Borkowski, Takeshi Kasama, Marco Beleggia, Giulio Pozzi
- Electron Tomography / Paul Anthony Midgley, Sara Bals
- Statistical Parameter Estimation Theory ₆ A Tool for Quantitative Electron Microscopy / Sandra Van Aert
- Dynamic Transmission Electron Microscopy / Nigel D Browning, Geoffrey H Campbell, James E Evans, Thomas B LaGrange, Katherine L Jungjohann, Judy S Kim, Daniel J Masiel, Bryan W Reed
- Transmission Electron Microscopy as Nanolab / Frans D Tichelaar, Marijn A van Huis, Henny W Zandbergen
- Atomic-Resolution Environmental Transmission Electron Microscopy / Pratibha L Gai, Edward D Boyes
- Speckles in Images and Diffraction Patterns / Michael M J Treacy
- Coherent Electron Diffractive Imaging / J M Zuo, Weijie Huang
- Sample Preparation Techniques for Transmission Electron Microscopy / Vasfi Burak Ozd̲l, Vesna Srot, Peter A van Aken
- Scanning Probe Microscopy ₆ History, Background, and State of the Art / Ralf Heiderhoff, Ludwig Josef Balk
- Scanning Probe Microscopy ₆ Forces and Currents in the Nanoscale World / Brian J Rodriguez, Roger Proksch, Peter Maksymovych, Sergei V Kalinin
- Scanning Beam Methods / David Joy
- Fundamentals of the Focused Ion Beam System / Nan Yao
- Low-Energy Electron Microscopy / Ernst Bauer
- Spin-Polarized Low-Energy Electron Microscopy / Ernst Bauer
- Imaging Secondary Ion Mass Spectroscopy / Katie L Moore, Markus Schr̲der, Chris R M Grovenor
- Soft X-Ray Imaging and Spectromicroscopy / Adam P Hitchcock
- Atom Probe Tomography: Principle and Applications / Frederic Danoix, Fraṅois Vurpillot
- Signal and Noise Maximum Likelihood Estimation in MRI / Jan Sijbers
- 3-D Surface Reconstruction from Stereo Scanning Electron Microscopy Images / Shafik Huq, Andreas Koschan, Mongi Abidi
- Applications. Nanoparticles / Miguel L̤pez-Haro, Juan Još Delgado, Juan Carlos Herǹndez-Garrido, Juan de Dios L̤pez-Castro, Čsar Mira, Susana Trasobares, Ana Beľn Hungr̕a, Još Antonio P̌rez-Omil, Još Juan Calvino
- Nanowires and Nanotubes / Yong Ding, Zhong Lin Wang
- Carbon Nanoforms / Carla Bittencourt, Gustaaf Van Tendeloo
- Metals and Alloys / Dominique Schryvers
- Transmission Electron Microscopy on Metals / J Th M De Hosson
- Semiconductors and Semiconducting Devices / Hugo Bender
- Complex Oxide Materials / Maria Varela, Timothy J Pennycook, Jaume Gazquez, Albina Y Borisevich, Sokrates T Pantelides, Stephen J Pennycook
- Application of Transmission Electron Microscopy in the Research of Inorganic Photovoltaic Materials / Yanfa Yan
- Polymers / Joachim Loos
- Ferroic and Multiferroic Materials / Ekhard Salje
- Three-Dimensional Imaging of Biomaterials with Electron Tomography / Montserrat B̀rcena, Roman I Koning, Abraham J Koster
- Small Organic Molecules and Higher Homologs / Ute Kolb, Tatiana E Gorelik
- Index.