Imaging study of multi-crystalline silicon wafers throughout the manufacturing process : preprint /

Bibliographic Details
Corporate Authors:	National Renewable Energy Laboratory (U.S.), IEEE Photovoltaic Specialists Conference
Other Authors:	Johnston, Steve
Format:	Government Document Conference Proceeding eBook
Language:	English
Published:	[Golden, Colo.] : National Renewable Energy Laboratory, [2011]
Series:	Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50724.
Subjects:	Silicon solar cells > Design and construction > Testing. Photoluminescence.
Online Access:	https://purl.fdlp.gov/GPO/gpo11180

Description
Item Description:	Title from title screen (viewed August 8, 2011). "July 2011." "Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011." Electronic resource.
Physical Description:	1 online resource (6 pages) : illustrations (some color).
Bibliography:	Includes bibliographical references (page 6).