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System voltage potential-induced degradation mechanisms in PV modules and methods for test : preprint /

Bibliographic Details
Corporate Authors: National Renewable Energy Laboratory (U.S.), IEEE Photovoltaic Specialists Conference
Other Authors: Hacke, Peter
Format: Government Document Conference Proceeding eBook
Language:English
Published: [Golden, Colo.] : National Renewable Energy Laboratory, [2011]
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-50716.
Subjects:
Photovoltaic power generation > Equipment and supplies > Service life.
Photovoltaic power systems > Reliability > Testing.
Online Access:https://purl.fdlp.gov/GPO/gpo11191
Description
Item Description:Title from title screen (viewed on Aug. 10, 2011).
"July 2011."
"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
Electronic resource.
Physical Description:1 online resource (7 pages) : illustrations (some color).
Bibliography:Includes bibliographical references (pages 6-7).