| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cas a2200000 a 4500 |
| 001 |
in00002711368 |
| 005 |
20151202142450.0 |
| 006 |
m f d |
| 007 |
cr bn||||||abp |
| 007 |
cr bn||||||ada |
| 008 |
100414d19942000cauar oo 1 a0eng c |
| 010 |
|
|
|a 2011263208
|
| 022 |
0 |
|
|y 1087-4852
|l 1087-4852
|2 1
|
| 035 |
|
|
|a (OCoLC)ocn607374162
|
| 035 |
|
|
|a (OCoLC)607374162
|
| 040 |
|
|
|a OCLCE
|b eng
|c OCLCE
|d OCLCQ
|d UtOrBLW
|
| 042 |
|
|
|a dlr
|a pcc
|
| 049 |
|
|
|a TXAM
|
| 050 |
1 |
4 |
|a TK7895.M4
|b I335
|
| 082 |
1 |
4 |
|a 004
|2 12
|
| 111 |
2 |
|
|a IEEE International Workshop on Memory Technology, Design, and Testing.
|
| 245 |
1 |
0 |
|a Records of the IEEE International Workshop on Memory Technology, Design, and Testing.
|
| 246 |
1 |
|
|i Some vols. have title:
|a Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing
|
| 246 |
3 |
0 |
|a Memory Technology, Design, and Testing
|
| 246 |
1 |
|
|i Issues for 1997-1998, 2001-2002, 1995- have title
|a Proceedings
|
| 264 |
|
1 |
|a [Los Alamitos, Calif.] :
|b [IEEE Computer Society Press],
|c [1994]-
|
| 264 |
|
4 |
|c ©2000
|
| 310 |
|
|
|a Annual
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 362 |
1 |
|
|a Began with: Aug. 8-9 (1994); ceased with: 2000.
|
| 500 |
|
|
|a Sponsored by the IEEE Computer Society Technical Committee on Test Technology; in cooperation with the IEEE Computer Society Technical Committee on VLSI.
|
| 588 |
|
|
|a Description based on: Aug. 8-9 (1994); title from issue table of contents (IEEE Xplore, viewed Aug. 28, 2011).
|
| 588 |
|
|
|a Latest issue consulted: 2000 (IEEE Xplore, viewed Aug. 28, 2011).
|
| 506 |
|
|
|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
|
| 533 |
|
|
|a Electronic reproduction.
|b [S.l.] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
|
| 583 |
1 |
|
|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
| 500 |
|
|
|a Electronic resource.
|
| 650 |
|
0 |
|a Semiconductor storage devices
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Random access memory
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Computer Society.
|b Test Technology Technical Committee.
|
| 710 |
2 |
|
|a IEEE Computer Society.
|b Technical Committee on VLSI.
|
| 776 |
0 |
8 |
|i Print version:
|a IEEE International Workshop on Memory Technology, Design, and Testing.
|t Records of the IEEE International Workshop on Memory Technology, Design, and Testing
|w (DLC)sn 96005299
|w (OCoLC)33274241
|
| 780 |
0 |
0 |
|a IEEE International Workshop on Memory Testing.
|t Records of the ... IEEE International Workshop on Memory Testing
|w (OCoLC)629676285
|
| 785 |
0 |
0 |
|a IEEE International Workshop on Memory Technology, Design, and Testing.
|b Proceedings
|
| 994 |
|
|
|a C0
|b TXA
|
| 948 |
|
|
|a cataloged
|b h
|c 2011/8/29
|d c
|e lfurubot
|f 4:18:43 pm
|g Temp record.
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s 4705b3d9-b083-3002-be3d-4c6eeb9bf673
|i 662ea0a0-5c34-30f3-b3eb-fe2a4fcca6da
|t 0
|
| 952 |
f |
f |
|a Texas A&M University
|b College Station
|c Electronic Resources
|d Available Online
|t 0
|e TK7895.M4 I335
|g Electronic
|h Library of Congress classification
|
| 998 |
f |
f |
|a TK7895.M4 I335
|t 0
|l Available Online
|
