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Records of the IEEE International Workshop on Memory Technology, Design, and Testing.

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Bibliographic Details
New Title:IEEE International Workshop on Memory Technology, Design, and Testing.
Previous Title:IEEE International Workshop on Memory Testing. Records of the ... IEEE International Workshop on Memory Testing
Corporate Authors: IEEE International Workshop on Memory Technology, Design, and Testing, IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Technical Committee on VLSI
Format: Conference Proceeding
Language:English
Published: [Los Alamitos, Calif.] : [IEEE Computer Society Press], [1994]-
Subjects:
Semiconductor storage devices > Testing > Congresses.
Random access memory > Congresses.
Online Availability: Check for online availability
Description
Published:Began with: Aug. 8-9 (1994); ceased with: 2000.
Item Description:Sponsored by the IEEE Computer Society Technical Committee on Test Technology; in cooperation with the IEEE Computer Society Technical Committee on VLSI.
Electronic resource.
Publication Frequency:Annual