Cover Image

Three-dimensional computed tomography as a method for finding die attach voids in diodes /

Bibliographic Details
Main Author: Brahm, E. N.
Corporate Author: George C. Marshall Space Flight Center
Other Authors: Rolin, T. D.
Format: Government Document eBook
Language:English
Published: [Huntsville], Ala. : National Aeronautics and Space Administration, Marshall Space Flight Center, [2010]
Series:NASA technical memorandum ; 216442.
Subjects:
Electromechanics.
Failure modes.
Diodes.
Detection.
Failure.
Metallography.
NASA PROGRAMS.
Radiography.
Online Access:https://purl.fdlp.gov/GPO/gpo11863
Description
Item Description:Title from title screen (viewed on Aug. 25, 2011).
"September 2010."
Electronic resource.
Physical Description:1 online resource (ix, 21 pages) : illustrations (some color).
Bibliography:Includes bibliographical references (page 21).