Atomic scale characterization and first-principles studies of Si₃N₄ interfaces /
| Main Author: | |
|---|---|
| Format: | Thesis eBook |
| Language: | English |
| Published: |
New York :
Springer,
[2011]
|
| Series: | Springer theses.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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