APA (7th ed.) Citation

Walkosz, W. (2011). Atomic scale characterization and first-principles studies of Si₃N₄ interfaces. Springer. https://doi.org/10.1007/978-1-4419-7817-2

Chicago Style (17th ed.) Citation

Walkosz, Weronika. Atomic Scale Characterization and First-principles Studies of Si₃N₄ Interfaces. New York: Springer, 2011. https://doi.org/10.1007/978-1-4419-7817-2.

MLA (9th ed.) Citation

Walkosz, Weronika. Atomic Scale Characterization and First-principles Studies of Si₃N₄ Interfaces. Springer, 2011. https://doi.org/10.1007/978-1-4419-7817-2.