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The use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells /

Bibliographic Details
Corporate Authors: National Renewable Energy Laboratory (U.S.), IEEE Photovoltaic Specialists Conference
Other Authors: Albin, David S.
Format: Government Document Conference Proceeding eBook
Language:English
Published: [Golden, Colo.] : National Renewable Energy Laboratory, [2011]
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-48393.
Subjects:
Photovoltaic cells > Research.
Solar cells > Testing.
Thin films.
Online Access:https://purl.fdlp.gov/GPO/gpo5980
Description
Item Description:Title from title screen (viewed March 21, 2011).
"March 2011."
"Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010."
Electronic resource.
Physical Description:1 online resource (7 pages) : color illustrations
Bibliography:Includes bibliographical references (pages 6-7).