Extreme statistics in nanoscale memory design /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Rutenbar, Rob A., 1957-, Singhee, Amith
Format: eBook
Language:English
Published: New York ; London : Springer, 2010.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:pages ; cm.
ISBN:1441966064
9781441966063
DOI:10.1007/978-1-4419-6606-3