Cover Image

Stress-induced phenomena in metallization : eleventh International Workshop on Stress-Induced Phenomena in Metallization, Bad Schandau, Germany, 12-14 April 2010 /

Show other versions (1)
Bibliographic Details
Corporate Author: International Workshop on Stress-Induced Phenomena in Metallization Bad Schandau, Germany
Other Authors: Zschech, Ehrenfried, Ho, P. S., Ogawa, Shinichi
Format: Conference Proceeding Book
Language:English
Published: Melville, N.Y. : American Institute of Physics, 2010.
Series:AIP conference proceedings ; no. 1300.
Subjects:
Interconnects (Integrated circuit technology) > Defects > Congresses.
Metal-metal bonds > Congresses.
Strength of materials > Congresses.
Nanostructured materials > Congresses.
Semiconductors > Congresses.
Copper > Electric properties > Congresses.
Search Result 1
Cover Image
Published 2009
Conference Proceeding Book
Show all versions (2)