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Stress-induced phenomena in metallization : eleventh International Workshop on Stress-Induced Phenomena in Metallization, Bad Schandau, Germany, 12-14 April 2010 /

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Bibliographic Details
Corporate Author: International Workshop on Stress-Induced Phenomena in Metallization Bad Schandau, Germany
Other Authors: Zschech, Ehrenfried, Ho, P. S., Ogawa, Shinichi
Format: Conference Proceeding Book
Language:English
Published: Melville, N.Y. : American Institute of Physics, 2010.
Series:AIP conference proceedings ; no. 1300.
Subjects:
Interconnects (Integrated circuit technology) > Defects > Congresses.
Metal-metal bonds > Congresses.
Strength of materials > Congresses.
Nanostructured materials > Congresses.
Semiconductors > Congresses.
Copper > Electric properties > Congresses.
Description
Physical Description:xi, 257 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780735408555
0735408556
ISSN:0094-243X ;