rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    non sort: A
    title: wideband frequency synthesizer for built-in self testing of analog integrated circuits
  name:
    name part: Yan, Wenjian.
    role:
      role term: creator
  name:
    name part: Silva-Martinez, Jose
    role:
      role term: thesis advisor.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: txu
    date issued: 2004
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource.
  abstract: The cost to test chips has risen tremendously. Additionally, the process for testing all functionalities of both analog and digital part is far from simple. One attractive option is moving some or all of the testing functions onto the chip itself leading to the use of built-in self-tests (BISTs). The frequency generator or frequency synthesizer is a key element of the BIST. It generates the clock frequencies needed for testing. A wide-band frequency synthesizer is designed in the project. The architecture of a PLL is analyzed as well as the modifications carried out. The modified structure has three blocks: basic PLL based frequency synthesizer, frequency down-converter, and output selector. Each of these blocks is analyzed and designed. This frequency synthesizer system overcomes challenges faced by the traditional PLL based frequency synthesizer.
  note: by Wenjian Yan.
  note: "Major Subject: Electrical Engineering"
  note: Title from author supplied metadata (record created on Nov. 30, 2005.)
  note: Vita.
  note: Abstract.
  note: Electronic resource.
  note: System requirements: Adobe Acrobat Reader.
  note: M. S. Texas A&M University 2004
  note: Includes bibliographical references.
  note: Text (Thesis).
  subject:
    topic: Major electrical engineering
  subject:
    topic: wideband
  subject:
    topic: BIST
  subject:
    topic: frequency synthesizer
  subject:
    topic: PLL
  subject:
    topic: built-in self test
  identifier: http://hdl.handle.net/1969.1/1059
  record info:
    record content source: TXA
    record creation date: 110119
    record change date: 20151202114135.0
    record identifier: in00002661079