Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

Full description

Bibliographic Details
Other Authors: Bowen, W. Richard, Hilal, Nidal
Format: eBook
Language:English
Published: Oxford ; Burlington, MA : Elsevier/Butterworth-Heinemann, 2009.
Edition:1st ed.
Subjects:
Online Access:Connect to the full text of this electronic book