Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...
| Other Authors: | Bowen, W. Richard, Hilal, Nidal |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Oxford ; Burlington, MA :
Elsevier/Butterworth-Heinemann,
2009.
|
| Edition: | 1st ed. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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