rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advanced test methods for SRAMs
    sub title: effective solutions for dynamic fault detection in nanoscaled technologies
  name:
    name part: Bosio, Alberto.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    date issued: 2010
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: xv, 171 pages : illustrations ; 24 cm.
  note: by Alberto Bosio [and others].
  note: Electronic resource.
  note: Electronic reproduction. New York : Springer, 2010. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on Aug. 9, 2010). Access may be restricted to users at subscribing institutions.
  note: Includes bibliographical references and index.
  subject:
    topic: Random access memory
    topic: Testing
  classification: TK7895.M4 A3185 2010
  classification: 621.3973
  related item:
    identifier: (OCoLC)477133277
  identifier: 1441909389
  identifier: 9781441909381
  identifier: 978-1-4419-0937-4 Springer
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: GW5XE
    record creation date: 100909
    record change date: 20210727155022.0
    record identifier: in00002657056
    language of cataloging:
      language term: eng