Charged semiconductor defects : structure, thermodynamics and diffusion /

Bibliographic Details
Main Author: Seebauer, Edmund G. (Edmund Gerard)
Corporate Author: SpringerLink (Online service)
Other Authors: Kratzer, Meredith C.
Format: eBook
Language:English
Published: London : Springer, [2009]
Series:Engineering materials and processes.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:xiv, 294 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:1848820593
9781848820593
DOI:10.1007/978-1-84882-059-3