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Reliability of nanoscale circuits and systems /

Bibliographic Details
Main Author: Stanisavljević, Miloš
Corporate Author: SpringerLink (Online service)
Other Authors: Leblebici, Yusuf, Schmid, Alexandre
Format: eBook
Language:English
Published: New York ; London : Springer, 2011.
Subjects:
Nanoelectromechanical systems > Reliability.
Nanoelectronics.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:pages cm.
ISBN:1441962174 (electronic bk.)
9781441962171 (electronic bk.)
DOI:10.1007/978-1-4419-6217-1