Stanisavljević, M., Leblebici, Y., & Schmid, A. (2011). Reliability of nanoscale circuits and systems. Springer. https://doi.org/10.1007/978-1-4419-6217-1
Chicago Style (17th ed.) CitationStanisavljević, Miloš, Yusuf Leblebici, and Alexandre Schmid. Reliability of Nanoscale Circuits and Systems. New York ; London: Springer, 2011. https://doi.org/10.1007/978-1-4419-6217-1.
MLA (9th ed.) CitationStanisavljević, Miloš, et al. Reliability of Nanoscale Circuits and Systems. Springer, 2011. https://doi.org/10.1007/978-1-4419-6217-1.
Warning: These citations may not always be 100% accurate.