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Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China /

Bibliographic Details
Corporate Author: International Conference on Advanced Measurement and Test Sanya Shi, China
Other Authors: Wu, Yanwen
Format: Conference Proceeding Book
Language:English
Published: Stafa-Zurich ; Enfield, NH : Trans-Tech Publications, [2010]
Series:Advanced materials research ; v. 108/111.
Subjects:
Materials > Testing > Congresses.
Materials science > Congresses.
Industrial design > Congresses.
Advanced measurements
Advanced tests
AMT
Description
Physical Description:2 volumes (xxi, 1542 pages) : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780878492695 (pbk.)
0878492690 (pbk.)
ISSN:1022-6680 ;