rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Trap level spectroscopy in amorphous semiconductors
  name:
    name part: Mikla, Victor I.
    role:
      role term: creator
  name:
    name part: ScienceDirect (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2010
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: pages ; cm.
  abstract: Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
  table of contents: Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.
  note: Viktor I. Mikla.
  note: Electronic resource.
  note: Electronic reproduction. Amsterdam : Elsevier Science & Technology, 2010. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on July 13, 2010). Access may be restricted to users at subscribing institutions.
  subject:
    topic: Amorphous semiconductors
    topic: Spectra
  subject:
    topic: Amorphous semiconductors
    topic: Defects
    topic: Analysis
  subject:
    topic: Deep level transient spectroscopy
  classification: QC611.8.A5 M55 2010
  classification: 537.6223
  related item:
    identifier: (OCoLC)567148516
  identifier: 9780123847157
  identifier: 012384715X
  identifier: 1098708:10929071 Elsevier Science & Technology
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: OPELS
    record creation date: 100714
    record change date: 20260609193438.4
    record identifier: in00002601573
    language of cataloging:
      language term: eng