Software metrics and software metrology /

Bibliographic Details
Main Author: Abran, Alain, 1949-
Format: Book
Language:English
Published: Hoboken, N.J. : Los Alamitos, CA : Wiley ; IEEE Computer Society, [2010]
Subjects:
Description
Physical Description:xix, 328 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780470597200 (pbk.)
0470597208 (pbk.)