A behavioral model of a built-in current sensor for IDDQ testing /

Bibliographic Details
Main Author:	Gharaibeh, Ammar
Other Authors:	Hu, Jiang (Thesis advisor), Walker, Duncan Moore Henry (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Tex.] : [Texas A&M University], [2010]
Subjects:	Major computer engineering. Built-in Current Sensor IDDQ Test Behavioral Model
Online Access:	Link to OAK Trust copy

Description
Abstract:	IDDQ testing is one of the most effective methods for detecting defects in integrated circuits. Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test. One solution is to use built-in current sensors. Several sensor techniques for measuring the current based on the magnetic field or voltage drop across the supply line have been proposed. In this work, we develop a behavioral model for a built-in current sensor measuring voltage drop and use this model to better understand sensor operation, identify the effect of different parameters on sensor resolution, and suggest design modifications to improve future sensor performance.
Item Description:	"Major Subject: Computer Engineering" Title from author supplied metadata (automated record created 2010-03-12 12:08:51). Electronic resource.
Physical Description:	1 online resource.
Bibliography:	Includes bibliographical references.