rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Precision nanometrology
    sub title: sensors and measuring systems for nanomanufacturing
  name:
    name part: Gao, Wei
    name part: Ph. D
    role:
      role term: creator
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2010
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: pages cm.
  note: by Wei Gao.
  note: Electronic resource.
  note: Electronic reproduction. New York : Springer, 2010. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on July 19, 2010). Access may be restricted to users at subscribing institutions.
  subject:
    topic: Nanostructured materials
    topic: Measurement
  classification: TA418.9.N35 G36 2010
  classification: 620.50287
  related item:
    identifier: (OCoLC)615914498
  related item:
    title info:
      title: Springer series in advanced manufacturing
  identifier: 1849962545
  identifier: 9781849962544
  identifier: 978-1-84996-253-7 Springer
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: GW5XE
    record creation date: 100810
    record change date: 20210727154851.0
    record identifier: in00002550861
    language of cataloging:
      language term: eng