An introduction to logic circuit testing /

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level und...

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Bibliographic Details
Main Author: Lala, Parag K., 1948-
Format: eBook
Language:English
Published: [San Rafael, Calif.] : Morgan & Claypool Publishers, [2009]
Series:Synthesis lectures on digital circuits and systems (Online) ; #17.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.
Item Description:Title from PDF title page (viewed Oct. 30, 2008).
Electronic resource.
Physical Description:x, 99 pages : illustrations, digital, PDF file.
Available also in print.
Format:Mode of access: World Wide Web.
Bibliography:Includes bibliographical references.
ISBN:9781598293517 (ebook)
1598293516 (ebook)
Access:Access may be restricted to subscribers.