Cover Image

Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /

Show other versions (3)
Bibliographic Details
Other Authors: Bowen, W. Richard, Hilal, Nidal
Format: Book
Language:English
Published: Burlington, Mass. : Butterworth-Heinemann, 2009.
Edition:1st ed.
Subjects:
Atomic force microscopy.
Production engineering.
Description
Physical Description:xvi, 283 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages 270-274) and index.
ISBN:9781856175173
1856175170